Seidel analysis of the optical aberrations induced by the OPD performance of the component under test is available within Fringe Master.
The calculation screen is displayed as shown in the panel (left). Data can be stored in an .sdf format file or sent to a printer to give a hard copy record.
Seidel analysis is used widely by optical designers to express the primary aberrations of optical systems. Unlike Zernike polynomials, they are non-orthogonal and their order of subtraction from the wavefront influences the residual aberration.